Modeling Minority-Carrier Lifetime Techniques That Use Transient Excess-Carrier Decay: Preprint

Steven Johnston

Modeling Minority-Carrier Lifetime Techniques That Use Transient Excess-Carrier Decay: Preprint

Materials Science

Research output: Contribution to conference › Paper

Abstract

Lifetime spectroscopy is a valuable tool for the characterization of PV materials. This paper combines modeling and experimental results to illustrate the injection-level dependent response of three transient excess-carrier decay techniques.

Original language	American English
Number of pages	9
State	Published - 2008
Event	33rd IEEE Photovoltaic Specialists Conference - San Diego, California Duration: 11 May 2008 → 16 May 2008

Conference

Conference	33rd IEEE Photovoltaic Specialists Conference
City	San Diego, California
Period	11/05/08 → 16/05/08

NREL Publication Number

NREL/CP-520-42569

Keywords

circuit modeling
excess-carrier decay
minority carriers
photoconductive
PV
transient absorption

Access to Document

https://www.nrel.gov/docs/fy08osti/42569.pdf

Cite this

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title = "Modeling Minority-Carrier Lifetime Techniques That Use Transient Excess-Carrier Decay: Preprint",

abstract = "Lifetime spectroscopy is a valuable tool for the characterization of PV materials. This paper combines modeling and experimental results to illustrate the injection-level dependent response of three transient excess-carrier decay techniques.",

keywords = "circuit modeling, excess-carrier decay, minority carriers, photoconductive, PV, transient absorption",

author = "Steven Johnston",

year = "2008",

language = "American English",

note = "33rd IEEE Photovoltaic Specialists Conference ; Conference date: 11-05-2008 Through 16-05-2008",

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T1 - Modeling Minority-Carrier Lifetime Techniques That Use Transient Excess-Carrier Decay: Preprint

AU - Johnston, Steven

PY - 2008

Y1 - 2008

N2 - Lifetime spectroscopy is a valuable tool for the characterization of PV materials. This paper combines modeling and experimental results to illustrate the injection-level dependent response of three transient excess-carrier decay techniques.

AB - Lifetime spectroscopy is a valuable tool for the characterization of PV materials. This paper combines modeling and experimental results to illustrate the injection-level dependent response of three transient excess-carrier decay techniques.

KW - circuit modeling

KW - excess-carrier decay

KW - minority carriers

KW - photoconductive

KW - PV

KW - transient absorption

M3 - Paper

T2 - 33rd IEEE Photovoltaic Specialists Conference

Y2 - 11 May 2008 through 16 May 2008

ER -

Modeling Minority-Carrier Lifetime Techniques That Use Transient Excess-Carrier Decay: Preprint

Abstract

Conference

NREL Publication Number

Keywords

Access to Document

Fingerprint

Cite this