Modeling Minority-Carrier Lifetime Techniques that Use Transient Excess-Carrier Decay (Poster)

Research output: NREL › Poster

Name	Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California

NREL Publication Number

This output contributes to the following UN Sustainable Development Goals (SDGs)

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title = "Modeling Minority-Carrier Lifetime Techniques that Use Transient Excess-Carrier Decay (Poster)",

keywords = "carrier, IEEE, lifetime, modeling, NREL, photovoltaic, PV, transient",

author = "Steven Johnston",

year = "2008",

language = "American English",

series = "Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California",

type = "Other",

}

TY - GEN

T1 - Modeling Minority-Carrier Lifetime Techniques that Use Transient Excess-Carrier Decay (Poster)

AU - Johnston, Steven

PY - 2008

Y1 - 2008

KW - carrier

KW - IEEE

KW - lifetime

KW - modeling

KW - NREL

KW - photovoltaic

KW - PV

KW - transient

M3 - Poster

T3 - Presented at the 33rd IEEE Photovoltaic Specialist Conference, 11-16 May 2008, San Diego, California

ER -