Modeling of Electrical Activity of Metallic Precipitates in Silicon Based on Schottky Effect

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages149-150
Number of pages2
StatePublished - 2000
EventProgram and 2000 NCPV Program Review Meeting - Denver, Colorado
Duration: 16 Apr 200019 Apr 2000

Conference

ConferenceProgram and 2000 NCPV Program Review Meeting
CityDenver, Colorado
Period16/04/0019/04/00

Bibliographical note

Work performed by Duke University, Durham, North Carolina

NREL Publication Number

  • NREL/CP-520-35707

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