Modeling Thermal Fatigue in CPV Cell Assemblies: Preprint

Research output: Contribution to conferencePaper


A finite element model has been created to quantify the thermal fatigue damage of the CPV die attach. Simulations are used to compare to results of empirical thermal fatigue equations originally developed for accelerated chamber cycling. While the empirical equations show promise when extrapolated to the lower temperature cycles characteristic of weather-induced temperature changes in the CPV dieattach, it is demonstrated that their damage does not accumulate linearly: the damage a particular cycle contributes depends on the preceding cycles. Simulations of modeled CPV cell temperature histories provided for direct comparison of the FEM and empirical methods, and for calculation of equivalent times provided by standard accelerated test sequences.
Original languageAmerican English
Number of pages8
StatePublished - 2011
Event37th IEEE Photovoltaic Specialists Conference (PVSC 37) - Seattle, Washington
Duration: 19 Jun 201124 Jun 2011


Conference37th IEEE Photovoltaic Specialists Conference (PVSC 37)
CitySeattle, Washington

NREL Publication Number

  • NREL/CP-5200-50685


  • CPV
  • FEM
  • thermal fatigue


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