Module Degradation Mechanisms Studied by a Multi-Scale Approach

Steven Johnston, Mowafak Al-Jassim, Peter Hacke, Steven Harvey, Chun Sheng Jiang, Harvey Guthrey, Helio Moutinho, David Albin, Bobby To, Gerald Tynan, John Moseley, Chuanxiao Xiao, Andreas Gerber, John Waddle, Marco Nardone, Jeffery Aguiar

Research output: Contribution to conferencePaperpeer-review

6 Scopus Citations


A key pathway to meeting the Department of Energy SunShot 2020 goals is to reduce financing costs by improving investor confidence through improved photovoltaic (PV) module reliability. A comprehensive approach to further understand and improve PV reliability includes characterization techniques and modeling from module to atomic scale. Imaging techniques, which include photoluminescence, electroluminescence, and lock-in thermography, are used to locate localized defects responsible for module degradation. Small area samples containing such defects are prepared using coring techniques and are then suitable and available for microscopic study and specific defect modeling and analysis.

Original languageAmerican English
Number of pages5
StatePublished - 18 Nov 2016
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 5 Jun 201610 Jun 2016


Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/TerritoryUnited States

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

NREL Publication Number

  • NREL/CP-5K00-65809


  • electroluminescence
  • imaging
  • photovoltaic cells
  • photovoltaic systems
  • reliability
  • silicon
  • solar energy
  • solar power generation


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