Morphology Control of Growth by Hydride Vapor Phase Epitaxy on Faceted GaAs Substrates Produced by Controlled Spalling for Low Cost III-V Devices

Anna Braun, Jacob Boyer, William McMahon, Kevin Schulte, John Simon, Corinne Packard, Aaron Ptak

Research output: NRELPresentation

Abstract

In this work, we apply the morphology control of hydride vapor phase epitaxial (HVPE) growth to planarize faceted, non-planar substrates. Controlled spalling is a promising high-throughput substrate reuse technology that could reduce substrate costs for III-V devices; however, the spalling fracture for (100)-oriented GaAs substrates produces a regularly corrugated surface of facets that are 5-20 um in height. We discuss how to planarize these surfaces using only a few minutes of HVPE growth and how to minimize the impact on throughput when integrating faceted wafers into a potential manufacturing process at scale.
Original languageAmerican English
Number of pages23
StatePublished - 2023

Publication series

NamePresented at the International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH), 15-18 May 2023, Orlando, Florida

NREL Publication Number

  • NREL/PR-5900-85452

Keywords

  • epitaxy
  • high throughput
  • HVPE
  • hydride vapor phase epitaxy
  • low cost
  • photovoltaic
  • PV
  • spalling

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