Morphology, Microstructure, and Luminescent Properties of CdS/CdTe Films

Research output: Contribution to conferencePaper

Abstract

This paper is concerned with the characterization of CdS/CdTe polycrystalline thin films for solar cells. The morphology, microstructure, and luminescent properties are studied by a powerful array of characterization techniques. The presence of pinholes in 100-nm thick CdS is observed. The microstructure of CdS and CdTe films is shown to be heavily faulted polycrystalline. The effect ofdeposition temperature on the grain size and the microstructure is investigated. The interdiffusion of sulfur and tellurium at the CdS/CdTe interface is studied for the first time by a nanoprobe technique. Considerable amount of sulfur is detected in CdTe in the vicinity of the interface of samples deposited at 625 deg. C. The recombination behavior of grain boundaries and intragrain defects isinvestigated in as-deposited and heat-treated samples.
Original languageAmerican English
Number of pages5
StatePublished - 1998
Event2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion - Vienna, Austria
Duration: 6 Jul 199810 Jul 1998

Conference

Conference2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion
CityVienna, Austria
Period6/07/9810/07/98

NREL Publication Number

  • NREL/CP-520-25122

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