Abstract
This paper is concerned with the characterization of CdS/CdTe polycrystalline thin films for solar cells. The morphology, microstructure, and luminescent properties are studied by a powerful array of characterization techniques. The presence of pinholes in 100-nm thick CdS is observed. The microstructure of CdS and CdTe films is shown to be heavily faulted polycrystalline. The effect ofdeposition temperature on the grain size and the microstructure is investigated. The interdiffusion of sulfur and tellurium at the CdS/CdTe interface is studied for the first time by a nanoprobe technique. Considerable amount of sulfur is detected in CdTe in the vicinity of the interface of samples deposited at 625 deg. C. The recombination behavior of grain boundaries and intragrain defects isinvestigated in as-deposited and heat-treated samples.
| Original language | American English |
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| Number of pages | 5 |
| State | Published - 1998 |
| Event | 2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion - Vienna, Austria Duration: 6 Jul 1998 → 10 Jul 1998 |
Conference
| Conference | 2nd World Conference and Exhibition on Photovoltaic Solar Energy Conversion |
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| City | Vienna, Austria |
| Period | 6/07/98 → 10/07/98 |
NREL Publication Number
- NREL/CP-520-25122