Abstract
Presented at the 2001 NCPV Program Review Meeting: Micro-PL, solid immersion lens microscopy, and near-field microscopy characterized the low-temperature PL of PV materials and devices with sub-micron spatial resolution.
Original language | American English |
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Number of pages | 4 |
State | Published - 2001 |
Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
Conference | NCPV Program Review Meeting |
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City | Lakewood, Colorado |
Period | 14/10/01 → 17/10/01 |
NREL Publication Number
- NREL/CP-520-31009
Keywords
- CdTe
- CIS
- high-spatial resolution
- micro-PL
- nanoscale
- NCPV
- optical spectroscopy
- PV