Nanometer-Scale Electrical Potential Profiling Across Perovskite Solar Cells

Chuanxiao Xiao, Chun Sheng Jiang, Mowafak Al-Jassim, Weijun Ke, Brian Gorman, Yanfa Yan, Changlei Wang

Research output: Contribution to conferencePaperpeer-review

1 Scopus Citations

Abstract

We used Kelvin probe force microscopy to study the potential distribution on cross-section of perovskite solar cells with different types of electron-transporting layers (ETLs). Our results explain the low open-circuit voltage and fill factor in ETL-free cells, and support the fact that intrinsic SnO2 as an alternative ETL material can make high-performance devices. Furthermore, the potential-profiling results indicate a reduction in junction-interface recombination by the optimized SnO2 layer and adding a fullerene layer, which is consistent with the improved device performance and current-voltage hysteresis.

Original languageAmerican English
Pages1197-1201
Number of pages5
DOIs
StatePublished - 18 Nov 2016
Event43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States
Duration: 5 Jun 201610 Jun 2016

Conference

Conference43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/TerritoryUnited States
CityPortland
Period5/06/1610/06/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

NREL Publication Number

  • NREL/CP-5K00-65749

Keywords

  • electrical potential
  • electron transporting layer
  • hysteresis
  • Kelvin probe force microscopy
  • perovskite
  • solar cell

Fingerprint

Dive into the research topics of 'Nanometer-Scale Electrical Potential Profiling Across Perovskite Solar Cells'. Together they form a unique fingerprint.

Cite this