Nanoparticle Shape and Configuration Analysis by Transmission Electron Tomography

S. P. Ahrenkiel, P. R. Yu, J. E. Murphy, J. M. Nedeljkovic, Bryon Donohoe

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Pages (from-to)382-387
Number of pages6
JournalJournal of Microscopy
Volume230
Issue number3
DOIs
StatePublished - 2008

NREL Publication Number

  • NREL/JA-270-44131

Keywords

  • imaging
  • microscopy
  • nanoparticles
  • reconstruction
  • semiconductors
  • tomography

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