Abstract
In this Solar Program Review Meeting, we report on our most recent progress in scanning probe microscopy (SPM) and its application to photovoltaics. We have developed an SPM to be operated in combination with a scanning electron microscope (SEM) JEOL5800. The SPM platform is compatible with a helium closed-circuit cryostat and fully accessible to the optics of the cathodoluminescence (CL)detectors with which the JEOL5800 is equipped. Among the innovative modes of operation that the combination --and synergy-- of SPM and electron microscopy provides, we describe (i) measurements of the lateral electron transport based on scanning tunneling microscopy (STM) and atomic force microscopy (AFM); (ii) scanning tunneling luminescence (STL); (iii) electroluminescence mapping; and (iv)near-field cathodoluminescence.
| Original language | American English |
|---|---|
| Number of pages | 5 |
| State | Published - 2005 |
| Event | 2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado Duration: 7 Nov 2005 → 10 Nov 2005 |
Conference
| Conference | 2005 DOE Solar Energy Technologies Program Review Meeting |
|---|---|
| City | Denver, Colorado |
| Period | 7/11/05 → 10/11/05 |
Bibliographical note
Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)NREL Publication Number
- NREL/CP-520-38951
Keywords
- film hydrogen content
- HWCVD a-Si:H films
- NREL
- photovoltaics (PV)
- PV
- rapid thermal annealing
- solar