Nanoprobes for Future Generations of Photovoltaics

Research output: Contribution to conferencePaper

Abstract

In this Solar Program Review Meeting, we report on our most recent progress in scanning probe microscopy (SPM) and its application to photovoltaics. We have developed an SPM to be operated in combination with a scanning electron microscope (SEM) JEOL5800. The SPM platform is compatible with a helium closed-circuit cryostat and fully accessible to the optics of the cathodoluminescence (CL)detectors with which the JEOL5800 is equipped. Among the innovative modes of operation that the combination --and synergy-- of SPM and electron microscopy provides, we describe (i) measurements of the lateral electron transport based on scanning tunneling microscopy (STM) and atomic force microscopy (AFM); (ii) scanning tunneling luminescence (STL); (iii) electroluminescence mapping; and (iv)near-field cathodoluminescence.
Original languageAmerican English
Number of pages5
StatePublished - 2005
Event2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado
Duration: 7 Nov 200510 Nov 2005

Conference

Conference2005 DOE Solar Energy Technologies Program Review Meeting
CityDenver, Colorado
Period7/11/0510/11/05

Bibliographical note

Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)

NREL Publication Number

  • NREL/CP-520-38951

Keywords

  • film hydrogen content
  • HWCVD a-Si:H films
  • NREL
  • photovoltaics (PV)
  • PV
  • rapid thermal annealing
  • solar

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