Nature of Charged Metastable Defects in Network Rebonding Model

Nature of Charged Metastable Defects in Network Rebonding Model

Research output: Contribution to conference › Paper

Original language	American English
Pages	429-433
Number of pages	5
State	Published - 2002
Event	Amorphous and Heterogeneous Silicon-Based Films 2002: Materials Research Society Symposium - San Francisco, California Duration: 2 Apr 2002 → 5 Apr 2002

Conference

Conference	Amorphous and Heterogeneous Silicon-Based Films 2002: Materials Research Society Symposium
City	San Francisco, California
Period	2/04/02 → 5/04/02

Bibliographical note

Work performed by Iowa State University, Ames, Iowa; University of Science and Technology of China, Hefei, People's Republic of China

NREL Publication Number

NREL/CP-520-34503

Cite this

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title = "Nature of Charged Metastable Defects in Network Rebonding Model",

author = "NREL",

note = "Work performed by Iowa State University, Ames, Iowa; University of Science and Technology of China, Hefei, People\'s Republic of China; Amorphous and Heterogeneous Silicon-Based Films 2002: Materials Research Society Symposium ; Conference date: 02-04-2002 Through 05-04-2002",

year = "2002",

language = "American English",

pages = "429--433",

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N1 - Work performed by Iowa State University, Ames, Iowa; University of Science and Technology of China, Hefei, People's Republic of China

PY - 2002

Y1 - 2002

M3 - Paper

SP - 429

EP - 433

T2 - Amorphous and Heterogeneous Silicon-Based Films 2002: Materials Research Society Symposium

Y2 - 2 April 2002 through 5 April 2002

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