New Method to Characterize TCO/P Contact Resistance in a-Si Solar Cells

New Method to Characterize TCO/P Contact Resistance in a-Si Solar Cells

Research output: Contribution to conference › Paper

Original language	American English
Pages	737-742
Number of pages	6
State	Published - 1999
Event	Materials Research Society Symposium - San Francisco, California Duration: 5 Apr 1999 → 9 Apr 1999

Conference

Conference	Materials Research Society Symposium
City	San Francisco, California
Period	5/04/99 → 9/04/99

Bibliographical note

Work performed by University of Delaware, Newark, Delaware and Solarex, Toano, Virginia

NREL Publication Number

NREL/CP-520-28455

Cite this

@conference{fd739a5edcf946a8a3da10e615a5f567,

title = "New Method to Characterize TCO/P Contact Resistance in a-Si Solar Cells",

author = "NREL",

note = "Work performed by University of Delaware, Newark, Delaware and Solarex, Toano, Virginia; Materials Research Society Symposium ; Conference date: 05-04-1999 Through 09-04-1999",

year = "1999",

language = "American English",

pages = "737--742",

}