New Sequentially Etched Quantum-Yield Technique for Measuring Surface Recombination Velocity and Diffusion Lengths of Solar Cells

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)5150-5158
    Number of pages9
    JournalJournal of Applied Physics
    Volume61
    Issue number11
    DOIs
    StatePublished - 1987

    Bibliographical note

    Work performed by Chevron Research Company, Richmond, California

    NREL Publication Number

    • ACNR/JA-9366

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