New Technique for the Determination of Mott-Schottky Parameters for Semiconductor/Electrolyte Junctions from Admittance Measurements and Equivalent Circuit Models

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Number of pages12
    StatePublished - 1982
    EventElectrochemical Society Meeting - Denver, Colorado
    Duration: 11 Oct 198116 Oct 1981


    ConferenceElectrochemical Society Meeting
    CityDenver, Colorado

    Bibliographical note

    Work performed by Department of Electrical Engineering, Colorado State University, Fort Collins, Colorado

    NREL Publication Number

    • ACNR/CP-4820

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