New, Ultrafast Technique for Mapping Dislocation Density in Large-Area, Single-Crystal and Multicrystalline Si Wafers: Paper No. 1210-Q01-02

Bhushan Sopori; Vinay Budhraja; Przemyslaw Rupnowski; Matt Albert; Chandra Khattak; Mike Seacrist

New, Ultrafast Technique for Mapping Dislocation Density in Large-Area, Single-Crystal and Multicrystalline Si Wafers: Paper No. 1210-Q01-02

Bhushan Sopori, Vinay Budhraja, Przemyslaw Rupnowski, Matt Albert, Chandra Khattak, Mike Seacrist

Research output: Contribution to conference › Paper

Original language	American English
Pages	15-20
Number of pages	6
State	Published - 2010
Event	2009 Materials Research Society Symposium - Boston, Massachusetts Duration: 29 Nov 2009 → 3 Dec 2009

Conference

Conference	2009 Materials Research Society Symposium
City	Boston, Massachusetts
Period	29/11/09 → 3/12/09

NREL Publication Number

NREL/CP-5200-46255

Keywords

dislocation density
optical scattering
solar cells

Cite this

@conference{0a2184e996d44702bffb1e3ead4ba2c2,

title = "New, Ultrafast Technique for Mapping Dislocation Density in Large-Area, Single-Crystal and Multicrystalline Si Wafers: Paper No. 1210-Q01-02",

keywords = "dislocation density, optical scattering, solar cells",

author = "Bhushan Sopori and Vinay Budhraja and Przemyslaw Rupnowski and Matt Albert and Chandra Khattak and Mike Seacrist",

year = "2010",

language = "American English",

pages = "15--20",

note = "2009 Materials Research Society Symposium ; Conference date: 29-11-2009 Through 03-12-2009",

}

TY - CONF

T1 - New, Ultrafast Technique for Mapping Dislocation Density in Large-Area, Single-Crystal and Multicrystalline Si Wafers

T2 - 2009 Materials Research Society Symposium

AU - Sopori, Bhushan

AU - Budhraja, Vinay

AU - Rupnowski, Przemyslaw

AU - Albert, Matt

AU - Khattak, Chandra

AU - Seacrist, Mike

PY - 2010

Y1 - 2010

KW - dislocation density

KW - optical scattering

KW - solar cells

M3 - Paper

SP - 15

EP - 20

Y2 - 29 November 2009 through 3 December 2009

ER -