New, Ultrafast Technique for Mapping Dislocation Density in Large-Area, Single-Crystal and Multicrystalline Si Wafers: Paper No. 1210-Q01-02

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages15-20
Number of pages6
StatePublished - 2010
Event2009 Materials Research Society Symposium - Boston, Massachusetts
Duration: 29 Nov 20093 Dec 2009

Conference

Conference2009 Materials Research Society Symposium
CityBoston, Massachusetts
Period29/11/093/12/09

NREL Publication Number

  • NREL/CP-5200-46255

Keywords

  • dislocation density
  • optical scattering
  • solar cells

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