Nitrogen-Induced Enhancement of the Free Electron Concentration in Sulfur Implanted GaNxAs1-x

K. M. Yu, W. Walukiewicz, W. Shan, J. Wu, J. W. Ager, E. E. Haller, J. F. Geisz, M. C. Ridgway

Research output: Contribution to journal › Article › peer-review

32 Scopus Citations

Fingerprint

Dive into the research topics of 'Nitrogen-Induced Enhancement of the Free Electron Concentration in Sulfur Implanted GaNxAs1-x'. Together they form a unique fingerprint.

Engineering

Material Science