Nitrogen-Stabilized H2* Defects in GaP:N

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages159-165
Number of pages7
StatePublished - 2002
EventDefect and Impurity Engineered Semiconductors and Devices III: Materials Research Society Symposium - San Francisco, California
Duration: 1 Apr 20025 Apr 2002

Conference

ConferenceDefect and Impurity Engineered Semiconductors and Devices III: Materials Research Society Symposium
CitySan Francisco, California
Period1/04/025/04/02

NREL Publication Number

  • NREL/CP-520-34225

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