Nitrogen-Stabilized H2* Defects in GaP:N

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Pages159-165
    Number of pages7
    StatePublished - 2002
    EventDefect and Impurity Engineered Semiconductors and Devices III: Materials Research Society Symposium - San Francisco, California
    Duration: 1 Apr 20025 Apr 2002

    Conference

    ConferenceDefect and Impurity Engineered Semiconductors and Devices III: Materials Research Society Symposium
    CitySan Francisco, California
    Period1/04/025/04/02

    NREL Publication Number

    • NREL/CP-520-34225

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