Nitrogen-Stabilized H2* Defects in GaP:N

Research output: Contribution to conference › Paper

Original language	American English
Pages	159-165
Number of pages	7
State	Published - 2002
Event	Defect and Impurity Engineered Semiconductors and Devices III: Materials Research Society Symposium - San Francisco, California Duration: 1 Apr 2002 → 5 Apr 2002

Conference	Defect and Impurity Engineered Semiconductors and Devices III: Materials Research Society Symposium
City	San Francisco, California
Period	1/04/02 → 5/04/02

NREL Publication Number