Abstract
It is the purpose of this research to develop specific imaging techniques that have the potential to be fast, in-line tools for quality control in thin-film CdTe solar cells. Electroluminescence (EL) and photoluminescence (PL) are two techniques that are currently under investigation on CdTe small area devices made at Colorado State University. It is our hope to significantly advance theunderstanding of EL and PL measurements as applied to CdTe. Qualitative analysis of defects and non-uniformities is underway on CdTe using EL, PL, and other imaging techniques.
Original language | American English |
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Number of pages | 6 |
State | Published - 2011 |
Event | 37th IEEE Photovoltaic Specialists Conference (PVSC 37) - Seattle, Washington Duration: 19 Jun 2011 → 24 Jun 2011 |
Conference
Conference | 37th IEEE Photovoltaic Specialists Conference (PVSC 37) |
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City | Seattle, Washington |
Period | 19/06/11 → 24/06/11 |
NREL Publication Number
- NREL/CP-5200-50793
Keywords
- CdTe
- electroluminescence
- imaging
- photoluminescence
- solar cells
- thin films