Abstract
Presented at the 2001 NCPV Program Review Meeting: Atomic density profile of selected atomic species in series of CdS/Zn2SnO4 junctions were studied by ADXRF.
| Original language | American English |
|---|---|
| Number of pages | 4 |
| State | Published - 2001 |
| Event | NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001 |
Conference
| Conference | NCPV Program Review Meeting |
|---|---|
| City | Lakewood, Colorado |
| Period | 14/10/01 → 17/10/01 |
NREL Publication Number
- NREL/CP-520-31024
Keywords
- atomic density profile
- CdS/Zn2SnO4 junction
- characterizations
- nondestructive
- x-ray florescence (XRF)