Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-ray Fluorescence

Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-ray Fluorescence

Research output: Contribution to conference › Paper

Original language	American English
Number of pages	2
State	Published - 2001
Event	2001 NCPV Program Review Meeting - Lakewood, Colorado Duration: 14 Oct 2001 → 17 Oct 2001

Conference

Conference	2001 NCPV Program Review Meeting
City	Lakewood, Colorado
Period	14/10/01 → 17/10/01

Bibliographical note

For preprint version, including full text online document, see NREL/CP-520-31024

NREL Publication Number

NREL/CP-520-34083

Cite this

@conference{a8331174dd674a19986e8895dd8aaf59,

title = "Nondestructive Characterization of Atomic Density Profile in CdS/Zn2SnO4 Junctions by X-ray Fluorescence",

author = "NREL",

note = "For preprint version, including full text online document, see NREL/CP-520-31024; 2001 NCPV Program Review Meeting ; Conference date: 14-10-2001 Through 17-10-2001",

year = "2001",

language = "American English",

}