Abstract
Angular dependence of x-ray fluorescence technique has been applied to the study of atomic density profile in composite systems. This method is shown to be useful for probing the microstructures and intermixing of constituent elements in layer-structured photovoltaic materials.
Original language | American English |
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Pages | 157-158 |
Number of pages | 2 |
State | Published - 2000 |
Event | Program and NCPV Program Review Meeting 2000 - Denver Colorado Duration: 16 Apr 2000 → 19 Apr 2000 |
Conference
Conference | Program and NCPV Program Review Meeting 2000 |
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City | Denver Colorado |
Period | 16/04/00 → 19/04/00 |
NREL Publication Number
- NREL/CP-520-29665
Keywords
- amorphous Si
- applications
- cadmium telluride (CdTe) photovoltaic solar cells modules
- components
- concentrators
- copper indium diselenide (CIS)
- crystalline silicon (x-Si) (c-Si)
- manufacturing
- markets
- NCPV
- photovoltaics (PV)
- research and development (R&D)
- systems
- systems integration
- thin films