Nondestructive Characterization of Atomic Profiles in Layer-Structured Photovoltaic Materials Using the Method of Angular Dependence of X-Ray Fluorescence (ADXRF)

    Research output: Contribution to conferencePaper

    Abstract

    Angular dependence of x-ray fluorescence technique has been applied to the study of atomic density profile in composite systems. This method is shown to be useful for probing the microstructures and intermixing of constituent elements in layer-structured photovoltaic materials.
    Original languageAmerican English
    Pages157-158
    Number of pages2
    StatePublished - 2000
    EventProgram and NCPV Program Review Meeting 2000 - Denver Colorado
    Duration: 16 Apr 200019 Apr 2000

    Conference

    ConferenceProgram and NCPV Program Review Meeting 2000
    CityDenver Colorado
    Period16/04/0019/04/00

    NREL Publication Number

    • NREL/CP-520-29665

    Keywords

    • amorphous Si
    • applications
    • cadmium telluride (CdTe) photovoltaic solar cells modules
    • components
    • concentrators
    • copper indium diselenide (CIS)
    • crystalline silicon (x-Si) (c-Si)
    • manufacturing
    • markets
    • NCPV
    • photovoltaics (PV)
    • research and development (R&D)
    • systems
    • systems integration
    • thin films

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