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Nondestructive Microstructural Investigation of Defects in 4H-SiC Epilayers Using a Multiscale Luminescence Analysis Approach
Sami El Hageali, Harvey Guthrey, Steven Johnston, Jake Soto, Bruce Odekirk, Brian Gorman, Mowafak Al-Jassim
Research output: Contribution to journal › Article › peer-review
5
Scopus Citations