Nonradiative Recombination Dominates Voltage Losses in Cu(In,Ga)Se2 Solar Cells Fabricated Using Different Methods: Article No. 2300075

Alexandra Bothwell, Jake Wands, Michael Miller, Ana Kanevce, Stefan Paetel, Polyxeni Tsoulka, Thomas Lepetit, Nicholas Barreau, Nicholas Valdes, William Shafarman, Angus Rockett, Aaron Arehart, Darius Kuciauskas

Research output: Contribution to journalArticlepeer-review

4 Scopus Citations

Abstract

Voltage losses reduce the photovoltaic conversion efficiency of thin-film solar cells, and are a primary efficiency limitation in Cu(In,Ga)Se2. This work presents a voltage loss analysis of Cu(In,Ga)Se2 solar cells fabricated at three institutions with variation in process, bandgap, absorber structure, post deposition treatment (PDT), and efficiency. Non-radiative voltage losses due to Shockley-Read-Hall (SRH) charge carrier recombination dominate and constitute >75% of the total compared to <25% from radiative voltage losses. The radiative voltage loss results from non-ideal absorption and carriers in band tails that stem from local composition-driven potential fluctuations. We show that significant bulk lifetime improvements are achieved for all alkali PDT processed absorbers, chiefly associated with reductions in non-radiative recombination. Primary voltage loss contributions-radiative and non-radiative-change little across fabrication processes, but variation in sub-mechanisms-bulk lifetime, net acceptor concentration, and interface recombination-differentiate non-radiative loss pathways in this series of solar cells.
Original languageAmerican English
Number of pages8
JournalSolar RRL
Volume7
Issue number11
DOIs
StatePublished - 2023

NREL Publication Number

  • NREL/JA-5900-85231

Keywords

  • CIGS
  • non-radiative recombination
  • solar cells
  • voltage losses

Fingerprint

Dive into the research topics of 'Nonradiative Recombination Dominates Voltage Losses in Cu(In,Ga)Se2 Solar Cells Fabricated Using Different Methods: Article No. 2300075'. Together they form a unique fingerprint.

Cite this