Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies: Paper No. 81120V

David Albin

Research output: Contribution to conference › Paper

Original language	American English
Number of pages	8
DOIs	https://doi.org/10.1117/12.896648
State	Published - 2011
Event	SPIE Conference - San Diego, California Duration: 22 Aug 2011 → 24 Aug 2011

See NREL/CP-5200-52392 for preprint

NREL Publication Number

@conference{a8e89b9365014ff3a34ae0dc32f9c7b2,

title = "Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies: Paper No. 81120V",

keywords = "algorithm, capacitance-voltage measurement, CdTe solar cell, chemometrics, data mining, durability, efficiency, reliability",

author = "David Albin",

note = "See NREL/CP-5200-52392 for preprint; SPIE Conference ; Conference date: 22-08-2011 Through 24-08-2011",

year = "2011",

doi = "10.1117/12.896648",

language = "American English",

}

TY - CONF

T1 - Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies

T2 - SPIE Conference

AU - Albin, David

N1 - See NREL/CP-5200-52392 for preprint

PY - 2011

Y1 - 2011

KW - algorithm

KW - capacitance-voltage measurement

KW - CdTe solar cell

KW - chemometrics

KW - data mining

KW - durability

KW - efficiency

KW - reliability

U2 - 10.1117/12.896648

DO - 10.1117/12.896648

M3 - Paper

Y2 - 22 August 2011 through 24 August 2011

ER -