Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies: Online Video Presentation (18 minutes)

R.L. Graham; David Albin; L.A. Clark

Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies: Online Video Presentation (18 minutes)

R.L. Graham, David Albin, L.A. Clark

Materials Science

Research output: NREL › Presentation

Original language	American English
State	Published - 2011

Publication series

Name	Presented at SPIE Optics + Photonics 2011, 21-25 August 2011, San Diego, California

Bibliographical note

Available on http://spie.org/opsolarpresentations.xml

NREL Publication Number

NREL/PR-5200-53397

Cite this

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title = "Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies: Online Video Presentation (18 minutes)",

author = "R.L. Graham and David Albin and L.A. Clark",

note = "Available on http://spie.org/opsolarpresentations.xml",

year = "2011",

language = "American English",

series = "Presented at SPIE Optics + Photonics 2011, 21-25 August 2011, San Diego, California",

type = "Other",

}

TY - GEN

T1 - Novel Approach for Correlating Capacitance Data with Performance During Thin-Film Device Stress Studies

T2 - Online Video Presentation (18 minutes)

AU - Graham, R.L.

AU - Albin, David

AU - Clark, L.A.

N1 - Available on http://spie.org/opsolarpresentations.xml

PY - 2011

Y1 - 2011

M3 - Presentation

T3 - Presented at SPIE Optics + Photonics 2011, 21-25 August 2011, San Diego, California

ER -