Observation and First-Principles Calculation of Buried Wurtzite Phases in Zinc-Blende CdTe Thin Films

Y. Yan; M. M. Al-Jassim; K. M. Jones; S. H. Wei; S. B. Zhang

doi:10.1063/1.1308062

Observation and First-Principles Calculation of Buried Wurtzite Phases in Zinc-Blende CdTe Thin Films

Y. Yan, M. M. Al-Jassim, K. M. Jones, S. H. Wei, S. B. Zhang

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to journal › Article › peer-review

62 Scopus Citations

Abstract

We report direct observation of the existence of buried thin wurtzite CdTe layers in nominally pure zinc-blende CdTe thin films using high-resolution transmission electron microscopy. The formation of the buried wurtzite layers is a result of the formation of high density of planar defects in the zinc-blende films - the wurtzite layers are formed by closely spaced lamellar twins. First-principles calculations reveal that the presence of the buried wurtzite layers may be responsible for the poor electrical properties of the polycrystalline zinc-blende CdTe films.

Original language	American English
Pages (from-to)	1461-1463
Number of pages	3
Journal	Applied Physics Letters
Volume	77
Issue number	10
DOIs	https://doi.org/10.1063/1.1308062 https://doi.org/10.1063/1.1308062
State	Published - 2000

NREL Publication Number

NREL/JA-520-28027

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abstract = "We report direct observation of the existence of buried thin wurtzite CdTe layers in nominally pure zinc-blende CdTe thin films using high-resolution transmission electron microscopy. The formation of the buried wurtzite layers is a result of the formation of high density of planar defects in the zinc-blende films - the wurtzite layers are formed by closely spaced lamellar twins. First-principles calculations reveal that the presence of the buried wurtzite layers may be responsible for the poor electrical properties of the polycrystalline zinc-blende CdTe films.",

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AU - Jones, K. M.

AU - Wei, S. H.

AU - Zhang, S. B.

PY - 2000

Y1 - 2000

N2 - We report direct observation of the existence of buried thin wurtzite CdTe layers in nominally pure zinc-blende CdTe thin films using high-resolution transmission electron microscopy. The formation of the buried wurtzite layers is a result of the formation of high density of planar defects in the zinc-blende films - the wurtzite layers are formed by closely spaced lamellar twins. First-principles calculations reveal that the presence of the buried wurtzite layers may be responsible for the poor electrical properties of the polycrystalline zinc-blende CdTe films.

AB - We report direct observation of the existence of buried thin wurtzite CdTe layers in nominally pure zinc-blende CdTe thin films using high-resolution transmission electron microscopy. The formation of the buried wurtzite layers is a result of the formation of high density of planar defects in the zinc-blende films - the wurtzite layers are formed by closely spaced lamellar twins. First-principles calculations reveal that the presence of the buried wurtzite layers may be responsible for the poor electrical properties of the polycrystalline zinc-blende CdTe films.

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JF - Applied Physics Letters

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ER -

Observation and First-Principles Calculation of Buried Wurtzite Phases in Zinc-Blende CdTe Thin Films

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