Observation of High PV Durability Under Harsh Sequential Stress

Dana Kern; Dennice Roberts; Sona Ulicna; David Miller; Xavier Hanna; Kent Terwilliger; Jimmy Newkirk; Rebecca Wai; Steve Johnston; Paul Ndione; John Mangum; Michael Owen-Bellini; Laura Schelhas

doi:10.1109/PVSC59419.2025.11132804

Observation of High PV Durability Under Harsh Sequential Stress

National Laboratory of the Rockies

Research output: Contribution to conference › Paper

Abstract

We study durability of photovoltaic (PV) components relevant to the increasingly popular glass/glass module packaging, using mini-modules with EVA, POE, and EPE encapsulants and full- versus half-cut cells. We use sequential stress testing with repeated cycles of damp heat, full-spectrum (UV-containing) light exposure, thermal cycling, and humidity freeze. We compare this indoor sequential stress to outdoor aging. Despite the harsh stress procedure, we observe <5 rel.% power loss for all materials tested, demonstrating the potential for high durability when quality PV module materials are used.

Original language	American English
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC59419.2025.11132804
State	Published - 2025
Event	53rd IEEE Photovoltaic Specialists Conference (PVSC 53) - Montreal, Canada Duration: 8 Jun 2025 → 13 Jun 2025

Conference

Conference	53rd IEEE Photovoltaic Specialists Conference (PVSC 53)
City	Montreal, Canada
Period	8/06/25 → 13/06/25

NLR Publication Number

NLR/CP-5K00-92840

Keywords

accelerated stress testing
durability
encapsulants
EPE
EVA
photovoltaics
POE
sequential stress testing

Access to Document

10.1109/PVSC59419.2025.11132804

Cite this

Kern, D., Roberts, D., Ulicna, S., Miller, D., Hanna, X., Terwilliger, K., Newkirk, J., Wai, R., Johnston, S., Ndione, P., Mangum, J., Owen-Bellini, M., & Schelhas, L. (2025). Observation of High PV Durability Under Harsh Sequential Stress. Paper presented at 53rd IEEE Photovoltaic Specialists Conference (PVSC 53), Montreal, Canada. https://doi.org/10.1109/PVSC59419.2025.11132804

@conference{cd80567907dd4a6e9c0455934ab08cbd,

title = "Observation of High PV Durability Under Harsh Sequential Stress",

abstract = "We study durability of photovoltaic (PV) components relevant to the increasingly popular glass/glass module packaging, using mini-modules with EVA, POE, and EPE encapsulants and full- versus half-cut cells. We use sequential stress testing with repeated cycles of damp heat, full-spectrum (UV-containing) light exposure, thermal cycling, and humidity freeze. We compare this indoor sequential stress to outdoor aging. Despite the harsh stress procedure, we observe <5 rel.\% power loss for all materials tested, demonstrating the potential for high durability when quality PV module materials are used.",

keywords = "accelerated stress testing, durability, encapsulants, EPE, EVA, photovoltaics, POE, sequential stress testing",

author = "Dana Kern and Dennice Roberts and Sona Ulicna and David Miller and Xavier Hanna and Kent Terwilliger and Jimmy Newkirk and Rebecca Wai and Steve Johnston and Paul Ndione and John Mangum and Michael Owen-Bellini and Laura Schelhas",

year = "2025",

doi = "10.1109/PVSC59419.2025.11132804",

language = "American English",

note = "53rd IEEE Photovoltaic Specialists Conference (PVSC 53) ; Conference date: 08-06-2025 Through 13-06-2025",

}

Kern, D , Roberts, D, Ulicna, S, Miller, D , Hanna, X , Terwilliger, K , Newkirk, J , Wai, R , Johnston, S , Ndione, P , Mangum, J , Owen-Bellini, M & Schelhas, L 2025, 'Observation of High PV Durability Under Harsh Sequential Stress', Paper presented at 53rd IEEE Photovoltaic Specialists Conference (PVSC 53), Montreal, Canada, 8/06/25 - 13/06/25. https://doi.org/10.1109/PVSC59419.2025.11132804

TY - CONF

T1 - Observation of High PV Durability Under Harsh Sequential Stress

AU - Kern, Dana

AU - Roberts, Dennice

AU - Ulicna, Sona

AU - Miller, David

AU - Hanna, Xavier

AU - Terwilliger, Kent

AU - Newkirk, Jimmy

AU - Wai, Rebecca

AU - Johnston, Steve

AU - Ndione, Paul

AU - Mangum, John

AU - Owen-Bellini, Michael

AU - Schelhas, Laura

PY - 2025

Y1 - 2025

N2 - We study durability of photovoltaic (PV) components relevant to the increasingly popular glass/glass module packaging, using mini-modules with EVA, POE, and EPE encapsulants and full- versus half-cut cells. We use sequential stress testing with repeated cycles of damp heat, full-spectrum (UV-containing) light exposure, thermal cycling, and humidity freeze. We compare this indoor sequential stress to outdoor aging. Despite the harsh stress procedure, we observe <5 rel.% power loss for all materials tested, demonstrating the potential for high durability when quality PV module materials are used.

AB - We study durability of photovoltaic (PV) components relevant to the increasingly popular glass/glass module packaging, using mini-modules with EVA, POE, and EPE encapsulants and full- versus half-cut cells. We use sequential stress testing with repeated cycles of damp heat, full-spectrum (UV-containing) light exposure, thermal cycling, and humidity freeze. We compare this indoor sequential stress to outdoor aging. Despite the harsh stress procedure, we observe <5 rel.% power loss for all materials tested, demonstrating the potential for high durability when quality PV module materials are used.

KW - accelerated stress testing

KW - durability

KW - encapsulants

KW - EPE

KW - EVA

KW - photovoltaics

KW - POE

KW - sequential stress testing

U2 - 10.1109/PVSC59419.2025.11132804

DO - 10.1109/PVSC59419.2025.11132804

M3 - Paper

T2 - 53rd IEEE Photovoltaic Specialists Conference (PVSC 53)

Y2 - 8 June 2025 through 13 June 2025

ER -

Observation of High PV Durability Under Harsh Sequential Stress

Abstract

Conference

NLR Publication Number

Keywords

Access to Document

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