Observed Trapping of Minority-Carrier Electrons in p-Type GaAsN During Deep-Level Transient Spectroscopy Measurement: Article No. 072109

Research output: Contribution to journalArticlepeer-review

Original languageAmerican English
Number of pages3
JournalApplied Physics Letters
Volume86
Issue number7
DOIs
StatePublished - 2005

NREL Publication Number

  • NREL/JA-520-36682

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