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Observed Trapping of Minority-Carrier Electrons in p-Type GaAsN During Deep-Level Transient Spectroscopy Measurement
S. W. Johnston, S. R. Kurtz, D. J. Friedman, A. J. Ptak, R. K. Ahrenkiel, R. S. Crandall
Research output: Contribution to journal › Article › peer-review
27
Scopus Citations