On the Reliability of Photovoltaic Short-Circuit Current Temperature Coefficient Measurements

Carl R. Osterwald, Mark Campanelli, George J. Kelly, Rafell Williams

Research output: Contribution to conferencePaperpeer-review

13 Scopus Citations

Abstract

The changes in short-circuit current of photovoltaic (PV) cells and modules with temperature are routinely modeled through a single parameter, the temperature coefficient (TC). This parameter is vital for the translation equations used in system sizing, yet in practice is very difficult to measure. In this paper, we discuss these inherent problems and demonstrate how they can introduce unacceptably large errors in PV ratings. A method for quantifying the spectral dependence of TCs is derived, and then used to demonstrate that databases of module parameters commonly contain values that are physically unreasonable. Possible ways to reduce measurement errors are also discussed.

Original languageAmerican English
Number of pages6
DOIs
StatePublished - 14 Dec 2015
Event42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States
Duration: 14 Jun 201519 Jun 2015

Conference

Conference42nd IEEE Photovoltaic Specialist Conference, PVSC 2015
Country/TerritoryUnited States
CityNew Orleans
Period14/06/1519/06/15

Bibliographical note

Publisher Copyright:
© 2015 IEEE.

NREL Publication Number

  • NREL/CP-5J00-63585

Keywords

  • photovoltaic cells
  • photovoltaic databases
  • photovoltaic modules
  • short-circuit current
  • temperature coefficient

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