Online Monitoring for Si Solar Cell Manufacturing

Bhushan Sopori; Srinivas Devayajanam; Rene Rivero; Peter Rupnowski

doi:10.1109/PVSC.2013.6744297

Online Monitoring for Si Solar Cell Manufacturing

Bhushan Sopori, Srinivas Devayajanam, Rene Rivero, Peter Rupnowski

Research output: Contribution to conference › Paper › peer-review

3 Scopus Citations

Abstract

We have developed an online monitoring system that can image various parameters of wafers and cells as they are transported over a conveyer belt. For silicon applications, these parameters include: sawing irregularities, texture quality and uniformity, AR coating thickness, metallization statistics on finger and busbar widths, and final 'visual inspection.' For a multicrystalline wafer, it also measures grain size and grain orientations. The system involves a light source and a line camera, to record the reflectance image of the wafer/cell moving at speeds up to 5 inches per second (ips). A high-speed computer then transforms the reflectance images into the appropriate parameter images. We will describe the essential principles of the system, image processing methods, and discuss examples of the applications in a manufacturing facility. The current system is a single wafer line, carrying wafers/cells at a speed of 2 inches per second. The imaging system can be adapted to existing conveyor belt assembly.

Original language	American English
Pages	939-944
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2013.6744297 https://doi.org/10.1109/PVSC.2013.6744297
State	Published - 2013
Externally published	Yes
Event	39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States Duration: 16 Jun 2013 → 21 Jun 2013

Conference

Conference	39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/Territory	United States
City	Tampa, FL
Period	16/06/13 → 21/06/13

NREL Publication Number

NREL/CP-5200-57903

Keywords

AR coating
Metallization line width
Reflectance imaging
Solar cell monitoring

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title = "Online Monitoring for Si Solar Cell Manufacturing",

abstract = "We have developed an online monitoring system that can image various parameters of wafers and cells as they are transported over a conveyer belt. For silicon applications, these parameters include: sawing irregularities, texture quality and uniformity, AR coating thickness, metallization statistics on finger and busbar widths, and final 'visual inspection.' For a multicrystalline wafer, it also measures grain size and grain orientations. The system involves a light source and a line camera, to record the reflectance image of the wafer/cell moving at speeds up to 5 inches per second (ips). A high-speed computer then transforms the reflectance images into the appropriate parameter images. We will describe the essential principles of the system, image processing methods, and discuss examples of the applications in a manufacturing facility. The current system is a single wafer line, carrying wafers/cells at a speed of 2 inches per second. The imaging system can be adapted to existing conveyor belt assembly.",

keywords = "AR coating, Metallization line width, Reflectance imaging, Solar cell monitoring",

author = "Bhushan Sopori and Srinivas Devayajanam and Rene Rivero and Peter Rupnowski",

year = "2013",

doi = "10.1109/PVSC.2013.6744297",

language = "American English",

pages = "939--944",

note = "39th IEEE Photovoltaic Specialists Conference, PVSC 2013 ; Conference date: 16-06-2013 Through 21-06-2013",

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T1 - Online Monitoring for Si Solar Cell Manufacturing

AU - Sopori, Bhushan

AU - Devayajanam, Srinivas

AU - Rivero, Rene

AU - Rupnowski, Peter

PY - 2013

Y1 - 2013

N2 - We have developed an online monitoring system that can image various parameters of wafers and cells as they are transported over a conveyer belt. For silicon applications, these parameters include: sawing irregularities, texture quality and uniformity, AR coating thickness, metallization statistics on finger and busbar widths, and final 'visual inspection.' For a multicrystalline wafer, it also measures grain size and grain orientations. The system involves a light source and a line camera, to record the reflectance image of the wafer/cell moving at speeds up to 5 inches per second (ips). A high-speed computer then transforms the reflectance images into the appropriate parameter images. We will describe the essential principles of the system, image processing methods, and discuss examples of the applications in a manufacturing facility. The current system is a single wafer line, carrying wafers/cells at a speed of 2 inches per second. The imaging system can be adapted to existing conveyor belt assembly.

AB - We have developed an online monitoring system that can image various parameters of wafers and cells as they are transported over a conveyer belt. For silicon applications, these parameters include: sawing irregularities, texture quality and uniformity, AR coating thickness, metallization statistics on finger and busbar widths, and final 'visual inspection.' For a multicrystalline wafer, it also measures grain size and grain orientations. The system involves a light source and a line camera, to record the reflectance image of the wafer/cell moving at speeds up to 5 inches per second (ips). A high-speed computer then transforms the reflectance images into the appropriate parameter images. We will describe the essential principles of the system, image processing methods, and discuss examples of the applications in a manufacturing facility. The current system is a single wafer line, carrying wafers/cells at a speed of 2 inches per second. The imaging system can be adapted to existing conveyor belt assembly.

KW - AR coating

KW - Metallization line width

KW - Reflectance imaging

KW - Solar cell monitoring

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DO - 10.1109/PVSC.2013.6744297

M3 - Paper

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T2 - 39th IEEE Photovoltaic Specialists Conference, PVSC 2013

Y2 - 16 June 2013 through 21 June 2013

ER -

Online Monitoring for Si Solar Cell Manufacturing

Abstract

Conference

NREL Publication Number

Keywords

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