Open-Circuit Photovoltage and Charge Recombination at Semiconductor/Liquid Interfaces

Duli Mao; Arthur J. Frank; Kong Jin Kim

doi:10.1149/1.2054901

Open-Circuit Photovoltage and Charge Recombination at Semiconductor/Liquid Interfaces

Duli Mao, Arthur J. Frank, Kong Jin Kim

Chemistry and Nanoscience

Research output: Contribution to journal › Article › peer-review

13 Scopus Citations

Abstract

A simple, quantitative relationship between the semiconductor surface recombination velocity (S^r) and the open-circuit photovoltage (V^oc) of photoelectrochemical systems was derived and verified experimentally. Experimental results obtained for the n-Si/acetone-FeCp²_+/0-LiClO⁴ junction indicate that V^oc is controlled by surface recombination. Quantitative analysis of the results using the derived expression yields values of the barrier height and S^r that compare favorably with published data. Application of the equation to other semiconductor/liquid junction cells suggests that the expression may be important in evaluating and understanding the behavior of a wide range of photoelectrochemical systems.

Original language	American English
Pages (from-to)	1231-1236
Number of pages	6
Journal	Journal of the Electrochemical Society
Volume	141
Issue number	5
DOIs	https://doi.org/10.1149/1.2054901 https://doi.org/10.1149/1.2054901
State	Published - 1994

NREL Publication Number

NREL/JA-452-6064

Keywords

photoelectrochemical cells solar cells
photoelectrochemistry
semiconductor-electrolyte boundaries
surface photovoltage surface recombination

Access to Document

Cite this

@article{1fdbbb4d9fcd4dc1a86dc6f2a7047cd9,

title = "Open-Circuit Photovoltage and Charge Recombination at Semiconductor/Liquid Interfaces",

abstract = "A simple, quantitative relationship between the semiconductor surface recombination velocity (Sr) and the open-circuit photovoltage (Voc) of photoelectrochemical systems was derived and verified experimentally. Experimental results obtained for the n-Si/acetone-FeCp2+/0-LiClO4 junction indicate that Voc is controlled by surface recombination. Quantitative analysis of the results using the derived expression yields values of the barrier height and Sr that compare favorably with published data. Application of the equation to other semiconductor/liquid junction cells suggests that the expression may be important in evaluating and understanding the behavior of a wide range of photoelectrochemical systems.",

keywords = "photoelectrochemical cells solar cells, photoelectrochemistry, semiconductor-electrolyte boundaries, surface photovoltage surface recombination",

author = "Duli Mao and Frank, {Arthur J.} and Kim, {Kong Jin}",

year = "1994",

doi = "10.1149/1.2054901",

language = "American English",

volume = "141",

pages = "1231--1236",

journal = "Journal of the Electrochemical Society",

issn = "0013-4651",

publisher = "Institute of Physics",

number = "5",

}

TY - JOUR

T1 - Open-Circuit Photovoltage and Charge Recombination at Semiconductor/Liquid Interfaces

AU - Mao, Duli

AU - Frank, Arthur J.

AU - Kim, Kong Jin

PY - 1994

Y1 - 1994

N2 - A simple, quantitative relationship between the semiconductor surface recombination velocity (Sr) and the open-circuit photovoltage (Voc) of photoelectrochemical systems was derived and verified experimentally. Experimental results obtained for the n-Si/acetone-FeCp2+/0-LiClO4 junction indicate that Voc is controlled by surface recombination. Quantitative analysis of the results using the derived expression yields values of the barrier height and Sr that compare favorably with published data. Application of the equation to other semiconductor/liquid junction cells suggests that the expression may be important in evaluating and understanding the behavior of a wide range of photoelectrochemical systems.

AB - A simple, quantitative relationship between the semiconductor surface recombination velocity (Sr) and the open-circuit photovoltage (Voc) of photoelectrochemical systems was derived and verified experimentally. Experimental results obtained for the n-Si/acetone-FeCp2+/0-LiClO4 junction indicate that Voc is controlled by surface recombination. Quantitative analysis of the results using the derived expression yields values of the barrier height and Sr that compare favorably with published data. Application of the equation to other semiconductor/liquid junction cells suggests that the expression may be important in evaluating and understanding the behavior of a wide range of photoelectrochemical systems.

KW - photoelectrochemical cells solar cells

KW - photoelectrochemistry

KW - semiconductor-electrolyte boundaries

KW - surface photovoltage surface recombination

UR - http://www.scopus.com/inward/record.url?scp=0028436480&partnerID=8YFLogxK

U2 - 10.1149/1.2054901

DO - 10.1149/1.2054901

M3 - Article

AN - SCOPUS:0028436480

SN - 0013-4651

VL - 141

SP - 1231

EP - 1236

JO - Journal of the Electrochemical Society

JF - Journal of the Electrochemical Society

IS - 5

ER -

Open-Circuit Photovoltage and Charge Recombination at Semiconductor/Liquid Interfaces

Abstract

NREL Publication Number

Keywords

Access to Document

Other files and links

Fingerprint

Cite this