Open-Circuit Voltage Decay - Measures of Amorphous Silicon Material Stability and Module Degradation

    Research output: Contribution to journalArticle

    Original languageAmerican English
    Pages (from-to)321-328
    Number of pages8
    JournalSolar Cells
    Issue number3-4
    StatePublished - 1988

    Bibliographical note

    Work performed by Department of Electrical and Computer Engineering, University of Notre Dame, Notre Dame, Indiana, and Solar Energy Research Institute Golden, Colorado

    NREL Publication Number

    • ACNR/JA-213-10518

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