Operando XPS Characterization of Selective Contacts: The Case of Molybdenum Oxide for Crystalline Silicon Heterojunction Solar Cells

Steven Harvey; Glenn Teeter; Laura Ding; Mariana Bertoni

doi:10.1109/PVSC.2016.7750330

Operando XPS Characterization of Selective Contacts: The Case of Molybdenum Oxide for Crystalline Silicon Heterojunction Solar Cells

Steven Harvey, Glenn Teeter, Laura Ding, Mariana Bertoni

Materials Science

Arizona State University

Research output: Contribution to conference › Paper › peer-review

2 Scopus Citations

Abstract

We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier-selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

Original language	American English
Pages	3543-3546
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2016.7750330 https://doi.org/10.1109/PVSC.2016.7750330
State	Published - 18 Nov 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: 5 Jun 2016 → 10 Jun 2016

Conference

Conference	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	5/06/16 → 10/06/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

NREL Publication Number

NREL/CP-5K00-67932

Keywords

carrier-selective contact
operando
silicon solar cell
x-ray photoelectron spectroscopy

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Harvey, S., Teeter, G., Ding, L., & Bertoni, M. (2016). Operando XPS Characterization of Selective Contacts: The Case of Molybdenum Oxide for Crystalline Silicon Heterojunction Solar Cells. 3543-3546. Paper presented at 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States. https://doi.org/10.1109/PVSC.2016.7750330, https://doi.org/10.1109/PVSC.2016.7750330

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abstract = "We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier-selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.",

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author = "Steven Harvey and Glenn Teeter and Laura Ding and Mariana Bertoni",

note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 ; Conference date: 05-06-2016 Through 10-06-2016",

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Harvey, S , Teeter, G, Ding, L & Bertoni, M 2016, 'Operando XPS Characterization of Selective Contacts: The Case of Molybdenum Oxide for Crystalline Silicon Heterojunction Solar Cells', Paper presented at 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 5/06/16 - 10/06/16 pp. 3543-3546. https://doi.org/10.1109/PVSC.2016.7750330, https://doi.org/10.1109/PVSC.2016.7750330

Operando XPS Characterization of Selective Contacts: The Case of Molybdenum Oxide for Crystalline Silicon Heterojunction Solar Cells. / Harvey, Steven ; Teeter, Glenn; Ding, Laura et al.
2016. 3543-3546 Paper presented at 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States.

Research output: Contribution to conference › Paper › peer-review

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AB - We demonstrate the potential of X-ray photoelectron spectroscopy (XPS) to characterize new carrier-selective contacts (CSC) for solar cell application. We show that XPS not only provides information about the surface chemical properties of the CSC material, but that operando XPS, i.e. under light bias condition, can also directly measure the photovoltage that develops at the CSC/absorber interface, revealing device relevant information without the need of assembling a full solar cell. We present the application of the technique to molybdenum oxide hole-selective contact films on a crystalline silicon absorber.

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KW - operando

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KW - x-ray photoelectron spectroscopy

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T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016

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ER -

Operando XPS Characterization of Selective Contacts: The Case of Molybdenum Oxide for Crystalline Silicon Heterojunction Solar Cells

Abstract

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Bibliographical note

NREL Publication Number

Keywords

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