Optical Analysis of Thin Film Combinatorial Libraries

J. D. Perkins, C. W. Teplin, M. F.A.M. Van Hest, J. L. Alleman, X. Li, M. S. Dabney, B. M. Keyes, L. M. Gedvilas, D. S. Ginley, Y. Lin, Y. Lu

Research output: Contribution to journalArticlepeer-review

34 Scopus Citations

Abstract

We have developed, and are using, optical reflection and transmission mapping as a characterization tool for analyzing compositionally graded thin film combinatorial libraries. Measurements cover the spectral range of 200nm to 25μm. For the UV-Vis-NIR region, a multichannel fiber optically coupled CCD array-based spectrometer is used for simultaneous reflection and transmission mapping. For the IR, a Fourier transform infrared (FTIR) spectrometer is used for sequential reflection and transmission maps. Depending upon the type of library being analyzed, the measured spectra can, with appropriate modeling, be analyzed for the optical band gap, film thickness, index of refraction, plasma frequency, conductivity, carrier scattering time and color, in addition to simple reflectance and transmittance. We discuss these techniques using examples taken from our work on both transparent conducting oxides and metal nitrides for optical coatings.

Original languageAmerican English
Pages (from-to)124-132
Number of pages9
JournalApplied Surface Science
Volume223
Issue number1-3
DOIs
StatePublished - 2004

NREL Publication Number

  • NREL/JA-520-35935

Keywords

  • Optical coatings
  • Thin film combinatorial libraries
  • Transparent conducting oxide (TCO)

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