Optical Characterization of Defects in High-Efficiency (Ag,Cu)(In,Ga)Se2

Siming Li; Rouin Farshchi; Michael Miller; Aaron Arehart; Darius Kuciauskas

doi:10.1109/PVSC45281.2020.9300566

Optical Characterization of Defects in High-Efficiency (Ag,Cu)(In,Ga)Se2

Siming Li, Rouin Farshchi, Michael Miller, Aaron Arehart, Darius Kuciauskas

Chemistry and Nanoscience

Research output: Contribution to conference › Paper › peer-review

Abstract

We applied time-resolved photoluminescence (TRPL) spectroscopy to study optimized chalcopyrite (Ag,Cu)(In,Ga)Se2 thin films. The device shows power conversion efficiency of 18.7%. The metastable defect VSe-VCu within ACIGS at \text{Ev}+0.98\ \text{eV} is detected in sub-bandgap TRPL excitation spectra. TRPL lifetime of 50 ns is limited by the density of mid-gap defects such as CuGaor CuIn. The similarity of TRPL dynamics before and after light soaking indicates the optimized ACIGS thin film is less metastable because the density of VCu-VSe defect is reduced to below 1015cm-3. This study indicates that ACIGS has improved cell efficiency and reliability characteristics.

Original language	American English
Pages	2567-2569
Number of pages	3
DOIs	https://doi.org/10.1109/PVSC45281.2020.9300566 https://doi.org/10.1109/PVSC45281.2020.9300566
State	Published - 14 Jun 2020
Event	47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: 15 Jun 2020 → 21 Aug 2020

Conference

Conference	47th IEEE Photovoltaic Specialists Conference, PVSC 2020
Country/Territory	Canada
City	Calgary
Period	15/06/20 → 21/08/20

Bibliographical note

Publisher Copyright:
© 2020 IEEE.

NREL Publication Number

NREL/CP-5900-77038

Keywords

ACIGS
metastability
photoluminescence
solar cells
thin film

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Cite this

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title = "Optical Characterization of Defects in High-Efficiency (Ag,Cu)(In,Ga)Se2",

abstract = "We applied time-resolved photoluminescence (TRPL) spectroscopy to study optimized chalcopyrite (Ag,Cu)(In,Ga)Se2 thin films. The device shows power conversion efficiency of 18.7%. The metastable defect VSe-VCu within ACIGS at \text{Ev}+0.98\ \text{eV} is detected in sub-bandgap TRPL excitation spectra. TRPL lifetime of 50 ns is limited by the density of mid-gap defects such as CuGaor CuIn. The similarity of TRPL dynamics before and after light soaking indicates the optimized ACIGS thin film is less metastable because the density of VCu-VSe defect is reduced to below 1015cm-3. This study indicates that ACIGS has improved cell efficiency and reliability characteristics.",

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doi = "10.1109/PVSC45281.2020.9300566",

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T1 - Optical Characterization of Defects in High-Efficiency (Ag,Cu)(In,Ga)Se2

AU - Li, Siming

AU - Farshchi, Rouin

AU - Miller, Michael

AU - Arehart, Aaron

AU - Kuciauskas, Darius

PY - 2020/6/14

Y1 - 2020/6/14

N2 - We applied time-resolved photoluminescence (TRPL) spectroscopy to study optimized chalcopyrite (Ag,Cu)(In,Ga)Se2 thin films. The device shows power conversion efficiency of 18.7%. The metastable defect VSe-VCu within ACIGS at \text{Ev}+0.98\ \text{eV} is detected in sub-bandgap TRPL excitation spectra. TRPL lifetime of 50 ns is limited by the density of mid-gap defects such as CuGaor CuIn. The similarity of TRPL dynamics before and after light soaking indicates the optimized ACIGS thin film is less metastable because the density of VCu-VSe defect is reduced to below 1015cm-3. This study indicates that ACIGS has improved cell efficiency and reliability characteristics.

AB - We applied time-resolved photoluminescence (TRPL) spectroscopy to study optimized chalcopyrite (Ag,Cu)(In,Ga)Se2 thin films. The device shows power conversion efficiency of 18.7%. The metastable defect VSe-VCu within ACIGS at \text{Ev}+0.98\ \text{eV} is detected in sub-bandgap TRPL excitation spectra. TRPL lifetime of 50 ns is limited by the density of mid-gap defects such as CuGaor CuIn. The similarity of TRPL dynamics before and after light soaking indicates the optimized ACIGS thin film is less metastable because the density of VCu-VSe defect is reduced to below 1015cm-3. This study indicates that ACIGS has improved cell efficiency and reliability characteristics.

KW - ACIGS

KW - metastability

KW - photoluminescence

KW - solar cells

KW - thin film

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DO - 10.1109/PVSC45281.2020.9300566

M3 - Paper

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T2 - 47th IEEE Photovoltaic Specialists Conference, PVSC 2020

Y2 - 15 June 2020 through 21 August 2020

ER -

Optical Characterization of Defects in High-Efficiency (Ag,Cu)(In,Ga)Se2

Abstract

Conference

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NREL Publication Number

Keywords

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