Abstract
A preliminary investigation of the optical characteristics of Gax In1-x As epilayers is presented. Gax In1-x As epilayers with x=0.465, 0.400, and 0.277 were prepared by metalorganic vapor-phase epitaxy (MOVPE) to represent a wide spectrum of TPV converter applications. Ellipsometric; measurements, combined with various characterization techniques and multi-layer modeling, are used to extract n(...lambda...) and k(...lambda...) for these epilayers. The validity of the results was checked by using the experimentally determined optical constants to calculate expected; reflectance, and then comparing this result against measured reflectance. Good agreement was obtained in all cases; larger differences were observed for samples having greater surface roughness. Suggestions for; improving theoptical constant determination procedure are given.
| Original language | American English |
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| Number of pages | 5 |
| State | Published - 1997 |
| Event | 26th IEEE Photovoltaic Specialists Conference - Anaheim, California Duration: 29 Sep 1997 → 3 Oct 1997 |
Conference
| Conference | 26th IEEE Photovoltaic Specialists Conference |
|---|---|
| City | Anaheim, California |
| Period | 29/09/97 → 3/10/97 |
NREL Publication Number
- NREL/CP-530-22975