Optical Characterization of Epitaxial GaxIn1-xAs Suitable for Thermophotovoltaic (TPV) Converters

    Research output: Contribution to conferencePaper


    A preliminary investigation of the optical characteristics of Gax In1-x As epilayers is presented. Gax In1-x As epilayers with x=0.465, 0.400, and 0.277 were prepared by metalorganic vapor-phase epitaxy (MOVPE) to represent a wide spectrum of TPV converter applications. Ellipsometric; measurements, combined with various characterization techniques and multi-layer modeling, are used to extract n(...lambda...) and k(...lambda...) for these epilayers. The validity of the results was checked by using the experimentally determined optical constants to calculate expected; reflectance, and then comparing this result against measured reflectance. Good agreement was obtained in all cases; larger differences were observed for samples having greater surface roughness. Suggestions for; improving theoptical constant determination procedure are given.
    Original languageAmerican English
    Number of pages5
    StatePublished - 1997
    Event26th IEEE Photovoltaic Specialists Conference - Anaheim, California
    Duration: 29 Sep 19973 Oct 1997


    Conference26th IEEE Photovoltaic Specialists Conference
    CityAnaheim, California

    NREL Publication Number

    • NREL/CP-530-22975


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