Optical Characterization of Epitaxial GaxIn1-xAs Suitable for Thermophotovoltaic (TPV) Converters

doi:10.1109/PVSC.1997.654249

Optical Characterization of Epitaxial GaxIn1-xAs Suitable for Thermophotovoltaic (TPV) Converters

NREL

Research output: Contribution to conference › Paper

Abstract

A preliminary investigation of the optical characteristics of Gax In1-x As epilayers is presented. Gax In1-x As epilayers with x=0.465, 0.400, and 0.277 were prepared by metalorganic vapor-phase epitaxy (MOVPE) to represent a wide spectrum of TPV converter applications. Ellipsometric; measurements, combined with various characterization techniques and multi-layer modeling, are used to extract n(...lambda...) and k(...lambda...) for these epilayers. The validity of the results was checked by using the experimentally determined optical constants to calculate expected; reflectance, and then comparing this result against measured reflectance. Good agreement was obtained in all cases; larger differences were observed for samples having greater surface roughness. Suggestions for; improving theoptical constant determination procedure are given.

Original language	American English
Pages	967-970
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.1997.654249
State	Published - 1997
Event	Twenty Sixth IEEE Photovoltaic Specialists Conference - Anaheim, California Duration: 29 Sep 1997 → 3 Oct 1997

Conference

Conference	Twenty Sixth IEEE Photovoltaic Specialists Conference
City	Anaheim, California
Period	29/09/97 → 3/10/97

Bibliographical note

For preprint version, including full text online documents, see NREL/CP-530-22975

NLR Publication Number

NREL/CP-520-25067

Access to Document

10.1109/PVSC.1997.654249

Cite this

@conference{88eb88a1117b48e7a94779d3aa4afb4b,

title = "Optical Characterization of Epitaxial GaxIn1-xAs Suitable for Thermophotovoltaic (TPV) Converters",

abstract = "A preliminary investigation of the optical characteristics of Gax In1-x As epilayers is presented. Gax In1-x As epilayers with x=0.465, 0.400, and 0.277 were prepared by metalorganic vapor-phase epitaxy (MOVPE) to represent a wide spectrum of TPV converter applications. Ellipsometric; measurements, combined with various characterization techniques and multi-layer modeling, are used to extract n(...lambda...) and k(...lambda...) for these epilayers. The validity of the results was checked by using the experimentally determined optical constants to calculate expected; reflectance, and then comparing this result against measured reflectance. Good agreement was obtained in all cases; larger differences were observed for samples having greater surface roughness. Suggestions for; improving theoptical constant determination procedure are given.",

author = "NREL",

note = "For preprint version, including full text online documents, see NREL/CP-530-22975; Twenty Sixth IEEE Photovoltaic Specialists Conference ; Conference date: 29-09-1997 Through 03-10-1997",

year = "1997",

doi = "10.1109/PVSC.1997.654249",

language = "American English",

pages = "967--970",

}

TY - CONF

T1 - Optical Characterization of Epitaxial GaxIn1-xAs Suitable for Thermophotovoltaic (TPV) Converters

AU - NREL, null

N1 - For preprint version, including full text online documents, see NREL/CP-530-22975

PY - 1997

Y1 - 1997

N2 - A preliminary investigation of the optical characteristics of Gax In1-x As epilayers is presented. Gax In1-x As epilayers with x=0.465, 0.400, and 0.277 were prepared by metalorganic vapor-phase epitaxy (MOVPE) to represent a wide spectrum of TPV converter applications. Ellipsometric; measurements, combined with various characterization techniques and multi-layer modeling, are used to extract n(...lambda...) and k(...lambda...) for these epilayers. The validity of the results was checked by using the experimentally determined optical constants to calculate expected; reflectance, and then comparing this result against measured reflectance. Good agreement was obtained in all cases; larger differences were observed for samples having greater surface roughness. Suggestions for; improving theoptical constant determination procedure are given.

AB - A preliminary investigation of the optical characteristics of Gax In1-x As epilayers is presented. Gax In1-x As epilayers with x=0.465, 0.400, and 0.277 were prepared by metalorganic vapor-phase epitaxy (MOVPE) to represent a wide spectrum of TPV converter applications. Ellipsometric; measurements, combined with various characterization techniques and multi-layer modeling, are used to extract n(...lambda...) and k(...lambda...) for these epilayers. The validity of the results was checked by using the experimentally determined optical constants to calculate expected; reflectance, and then comparing this result against measured reflectance. Good agreement was obtained in all cases; larger differences were observed for samples having greater surface roughness. Suggestions for; improving theoptical constant determination procedure are given.

U2 - 10.1109/PVSC.1997.654249

DO - 10.1109/PVSC.1997.654249

M3 - Paper

SP - 967

EP - 970

T2 - Twenty Sixth IEEE Photovoltaic Specialists Conference

Y2 - 29 September 1997 through 3 October 1997

ER -

Optical Characterization of Epitaxial GaxIn1-xAs Suitable for Thermophotovoltaic (TPV) Converters

Abstract

Conference

Bibliographical note

NLR Publication Number

Access to Document

Fingerprint

Cite this