Optical Modeling of Polysilicon: TOPCon PV

Arihana Roos, Eric Rada, William Nemeth, David Young, Jason Stoke

Research output: NRELPoster

Abstract

Determine how film thickness changes with different deposition methods. Analyze relationship between film thickness and optical constants. The deposition rate of intrinsic polysilicon is higher during initial deposition then begins to slow down as deposition time increases. Longer depositions of polysilicon are more crystalline in structure than shorter depositions. N-type doping of polysilicon is more crystalline in structure than p-type doping, despite similar film thicknesses.
Original languageAmerican English
PublisherNational Renewable Energy Laboratory (NREL)
StatePublished - 2024

Publication series

NamePresented at the Murdock College Science Research Conference, 8-9 November 2024, Vancouver, Washington

NREL Publication Number

  • NREL/PO-5900-91175

Keywords

  • Bruggeman effective media approximation
  • EMA
  • general oscillator
  • optical model
  • photovoltaic
  • poly-Si
  • polysilicon
  • PV
  • TOPCon
  • tunnel oxide passivated contact

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