Abstract
Zn(O,S) thin films 27 - 100 nm thick were deposited on glass or Cu(InxGa1-x)Se2/Molybdenum/glass with RF sputtering, atomic layer deposition, and chemical bath deposition.
Original language | American English |
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Number of pages | 6 |
State | Published - 2012 |
Event | 2012 IEEE Photovoltaic Specialists Conference - Austin, Texas Duration: 3 Jun 2012 → 8 Jun 2012 |
Conference
Conference | 2012 IEEE Photovoltaic Specialists Conference |
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City | Austin, Texas |
Period | 3/06/12 → 8/06/12 |
NREL Publication Number
- NREL/CP-5200-54128
Keywords
- dielectric constant
- ellipsometry
- nanocrystals
- photovoltaic cells
- semiconductors
- thin films
- wide band gap
- zinc compounds