Abstract
Amorphous mixed metal oxide TCOs are of increasing interest due to the excellent opto-electronic properties and smoothness (RRMS < 0.5 nm) obtained for sputtered films deposited at less than 100 ..deg..C. Here, we have investigated the combined materials phase space of oxygen stoichiometry and metals composition (In:Zn ratio) and made two key discoveries.
| Original language | American English |
|---|---|
| Number of pages | 5 |
| State | Published - 2008 |
| Event | 33rd IEEE Photovoltaic Specialists Conference - San Diego, California Duration: 11 May 2008 → 16 May 2008 |
Conference
| Conference | 33rd IEEE Photovoltaic Specialists Conference |
|---|---|
| City | San Diego, California |
| Period | 11/05/08 → 16/05/08 |
NLR Publication Number
- NREL/CP-520-42546
Keywords
- amorphous silicon
- antireflection coatings
- chemical barriers
- electrical contacts
- PV
- thin films
- transparent conducting oxides (TCO)
- X-ray diffraction