Abstract
Thin film synthesis allows for the potential to orient crystals in different orientations, permitting measurement of orientation-dependent material aspects such as band structures and transport anisotropy. Here, Dirac semimetal Cd3 As2 films are epitaxially grown on GaAs[110] substrates, which has a [001] orientation in-plane. Films contain domains of two different c-axis orientations resulting from an aligned a-axis in-plane. Magnetoresistance measurements performed along both [1 10] and [001] substrate directions reveal similar mobility and carrier concentration, but much larger magnetoresistance along the [001] direction, which can be explained by the guiding center diffusion model as arising from anisotropic disorder and different atomic spacings.
| Original language | American English |
|---|---|
| Number of pages | 7 |
| Journal | Journal of Applied Physics |
| Volume | 139 |
| Issue number | 3 |
| DOIs | |
| State | Published - 2026 |
NLR Publication Number
- NLR/JA-5K00-96679
Keywords
- electrical characterization
- epitaxy
- magnetoresistance
- TEM
- topological semi-metals