Overcoming Carrier Concentration Limits in Polycrystalline CdTe Thin Films with In Situ Doping

Brian E. McCandless, Wayne A. Buchanan, Christopher P. Thompson, Gowri Sriramagiri, Robert J. Lovelett, Joel Duenow, David Albin, Søren Jensen, Eric Colegrove, John Moseley, Helio Moutinho, Steve Harvey, Mowafak Al-Jassim, Wyatt K. Metzger

Research output: Contribution to journalArticlepeer-review

94 Scopus Citations

Abstract

Thin film materials for photovoltaics such as cadmium telluride (CdTe), copper-indium diselenide-based chalcopyrites (CIGS), and lead iodide-based perovskites offer the potential of lower solar module capital costs and improved performance to microcrystalline silicon. However, for decades understanding and controlling hole and electron concentration in these polycrystalline films has been extremely challenging and limiting. Ionic bonding between constituent atoms often leads to tenacious intrinsic compensating defect chemistries that are difficult to control. Device modeling indicates that increasing CdTe hole density while retaining carrier lifetimes of several nanoseconds can increase solar cell efficiency to 25%. This paper describes in-situ Sb, As, and P doping and post-growth annealing that increases hole density from historic 1014 limits to 1016–1017 cm−3 levels without compromising lifetime in thin polycrystalline CdTe films, which opens paths to advance solar performance and achieve costs below conventional electricity sources.

Original languageAmerican English
Article numberArticle No. 14519
Number of pages13
JournalScientific Reports
Volume8
Issue number1
DOIs
StatePublished - 1 Dec 2018

Bibliographical note

Publisher Copyright:
© 2018, The Author(s).

NREL Publication Number

  • NREL/JA-5K00-72611

Keywords

  • semiconductors
  • solar cells
  • solar performance
  • thin films

Fingerprint

Dive into the research topics of 'Overcoming Carrier Concentration Limits in Polycrystalline CdTe Thin Films with In Situ Doping'. Together they form a unique fingerprint.

Cite this