Overcoming Degradation Pathways to Achieve Stable Blue Perovskite Light-Emitting Diodes

Shuai Yuan, Xiaopeng Zheng, Xiaopeng Zheng, Wan-Shan Shen, Jiakai Liu, Lin-Song Cui, Congcong Zhang, Qi-Sheng Tian, Jun-Jie Wu, Yu-Hang Zhou, Xue-Dong Wang, Zhao-Kui Wang, Peigang Han, Joseph Luther, Osman Bakr, Liang-Sheng Liao

Research output: Contribution to journalArticlepeer-review

29 Scopus Citations


Mixed halide (Br/Cl) perovskite nanocrystals (NCs) that represent an advanced blue emitter commonly suffer from spectral instability and poor lifespan; notably, the lack of understanding of the failure mechanisms of these devices has restricted the future progress. Here, we determine that the degradation of CsPbBrxCl3-x NCs containing blue light-emitting diodes (LEDs) is due to the combination of two effects. Cl- drift among adjoining NCs under an electric field is found to induce a Cl-deficient material region in multiple NC layers, which dominates the unstable electroluminescence and causes fast degradation in the corresponding devices. In comparison, the monolayer NC devices that feature restricted anion drift pathways exhibit better operational stability; however, excess hole injection is demonstrated to induce irreversible chlorine loss in NCs. Such a process that largely arises from electrochemical oxidation of Cl- initiates a mild device failure in operation of tens of minutes. Through revealing these mechanisms, we modulate the devices' construction and operational conditions to achieve a longer lifespan.

Original languageAmerican English
Pages (from-to)1348-1354
Number of pages7
JournalACS Energy Letters
Issue number4
StatePublished - 2022

Bibliographical note

Publisher Copyright:
© 2022 American Chemical Society.

NREL Publication Number

  • NREL/JA-5900-82746


  • blue emitter
  • blue light emitting diodes
  • degradation pathways
  • device failures
  • failure mechanism
  • holes injection
  • lifespans
  • light emitting diode
  • material region
  • operational stability


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