Overcoming Diffusion-Related Limitations in Semiconductor Defect Imaging with Phonon-Plasmon-Coupled Mode Raman Scattering: Article No. 23

Changkui Hu, Qiong Chen, Fengxiang Chen, T. Gfroerer, Yong Zhang

Research output: Contribution to journal › Article › peer-review

17 Scopus Citations

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