Partial Shade Stress Test for Thin-Film Photovoltaic Modules: Preprint

Research output: Contribution to conferencePaper


Partial shade of monolithic thin-film PV modules can cause reverse-bias conditions leading to permanent damage. In this work, we propose a partial shade stress test for thin-film PV modules that quantifies permanent performance loss. We designed the test with the aid of a computer model that predicts the local voltage, current and temperature stress that result from partial shade. The model predicts the module-scale interactions among the illumination pattern, the electrical properties of the photovoltaic material and the thermal properties of the module package. The test reproduces shading and loading conditions that may occur in the field. It accounts for reversible light-induced performance changes and for additional stress that may be introduced by light-enhanced reverse breakdown. We present simulated and experimental results from the application of the proposed test.
Original languageAmerican English
Number of pages14
StatePublished - 2015
EventSPIE Optics + Photonics - San Diego, California
Duration: 9 Aug 201513 Aug 2015


ConferenceSPIE Optics + Photonics
CitySan Diego, California

NREL Publication Number

  • NREL/CP-5J00-64456


  • photovoltaics (PV)
  • reliability
  • simulation
  • thin films


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