Passivation of Deep Electronic States of Partial Dislocations in GaAs: A Theoretical Study

Lixin Zhang, W. E. McMahon, Su Huai Wei

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27 Scopus Citations

Abstract

The structure and electronic properties of reconstructed cores of 90° partial dislocations in GaAs are studied using first-principles methods. We find that a double-period reconstruction is most stable for an As-core whereas a single-period reconstruction is most stable for a Ga-core. We show that As and Ga dimers induce detrimental deep electronic states. These deep levels can be partially removed by introducing passivating dopants that break dimers in the dislocation core.

Original languageAmerican English
Article number121912
Number of pages3
JournalApplied Physics Letters
Volume96
Issue number12
DOIs
StatePublished - 2010

NREL Publication Number

  • NREL/JA-590-46868

Keywords

  • passivation
  • semiconductors
  • zincblende

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