Passivation of Interfaces in High-Efficiency Photovoltaic Devices

Sarah R. Kurtz, J. M. Olson, D. J. Friedman, J. F. Geisz, K. A. Bertness, A. E. Kibbler

Research output: Contribution to conferencePaperpeer-review

43 Scopus Citations

Abstract

Solar cells made from III-V materials have achieved efficiencies greater than 30%. Effectively ideal passivation plays an important role in achieving these high efficiencies. Standard modeling techniques are applied to Ga0.5In0.5P solar cells to show the effects of passivation. Accurate knowledge of the absorption coefficient is essential (see appendix). Although ultralow (<2 cm/s) interface recombination velocities have been reported, in practice, it is difficult to achieve such low recombination velocities in solar cells because the doping levels are high and because of accidental incorporation of impurities and dopant diffusion. Examples are given of how dopant diffusion can both help and hinder interface passivation, and of how incorporation of oxygen or hydrogen can cause problems.

Original languageAmerican English
Pages95-106
Number of pages12
DOIs
StatePublished - 1999
EventProceedings of the 1999 MRS Spring Meeting - Symposium Z, 'Compound Semiconductor Surface Passivation and Novel Device Processing' - San Francisco, CA, USA
Duration: 5 Apr 19997 Apr 1999

Conference

ConferenceProceedings of the 1999 MRS Spring Meeting - Symposium Z, 'Compound Semiconductor Surface Passivation and Novel Device Processing'
CitySan Francisco, CA, USA
Period5/04/997/04/99

NREL Publication Number

  • NREL/CP-520-27221

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